XRD study of strongly textured and stressed thin films
نویسندگان
چکیده
منابع مشابه
architecture and engineering of nanoscale sculptured thin films and determination of their properties
چکیده ندارد.
15 صفحه اولDiffusion in Stressed Thin Films
The effect of mechanical stress on interdiffusion in a binary substitutional solid solution has been investigated from a theoretical point of view. Fick's first law, stating that the diffusional flux is proportional to the concentration (chemical potential) gradient, is the basic equation for diffusional mass transport. Limits of its validity, in particular in a state of non-hydrostatic stress,...
متن کاملSynthesis and characterization of highly textured Ptâ•fiBi thin films
Pt–Bi films were synthesized on glass and thermally oxidized silicon substrates by e-beam evaporation and annealing. The structures were characterized using X-ray diffraction (XRD) and transmission electron microscopy/selected area electron diffraction (TEM/SAED) techniques. Single-phase PtBi was obtained at an annealing temperature of 300°C, whereas a higher annealing temperature of 400°C was ...
متن کاملSynthesis and characterization of highly textured Pt–Bi thin films
Pt–Bi films were synthesized on glass and thermally oxidized silicon substrates by e-beam evaporation and annealing. The structures were characterized using X-ray diffraction (XRD) and transmission electron microscopy/selected area electron diffraction (TEM/SAED) techniques. Single-phase PtBi was obtained at an annealing temperature of 300°C, whereas a higher annealing temperature of 400°C was ...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2005
ISSN: 0108-7673
DOI: 10.1107/s0108767305082450